data sheet doc. no : qw0905- rev. : date : 19 - jul.- 2006 a LDBK43743 LDBK43743 lead-free parts pb ligitek electronics co.,ltd. property of ligitek only oval type led lamps
7.0 3.8 1.0min 25.0min 0.5 typ 2.54typ 1.5 max 5.2 ligitek electronics co.,ltd. property of ligitek only package dimensions 1/5 page LDBK43743 part no. note : 1.all dimension are in millimeter tolerance is 0.25mm unless otherwise noted. 2.specifications are subject to change without notice. directivity radiation vertcal axis 26 75% radiation angle(0.5):h 78 degree/v 26 degree 100% -60 25% 50% 0 25%100% 50%75% -30 0 60 horizontal axis 78 30 + -
water clear color lens ingan/gan material LDBK43743 part no blue emitted 1100 luminous intensity @20ma(mcd) typ. 30 spectral halfwidth nm 470 dominant wave length dnm 4.0 max. forward voltage @ ma(v) 3.5 typ. 20 700 min. viewing angle 2 1/2 (deg) 2/5 page ligitek electronics co.,ltd. property of ligitek only unit ma ma a v mw 30 100 dbk ratings 50 150 ir -20 ~ +80 -30 ~ +100 120 forward current peak forward current duty 1/10@10khz parameter operating temperature storage temperature electrostatic discharge( * ) reverse current @5v power dissipation typical electrical & optical characteristics (ta=25 ) symbol esd t opr tstg i f pd i fp absolute maximum ratings at ta=25 note : 1.the forward voltage data did not including 0.1v testing tolerance. 2. the luminous intensity data did not including 15% testing tolerance. static electricity or power surge will damage the led. use of a conductive wrist band or anti-electrosatic glove is recommended when handing these led. all devices, equipment and machinery must be properly grounded. * vertical axis 26 horizontal axis 78 part no. LDBK43743
fig.5 relative intensity vs. wavelength typical electro-optical characteristics curve ligitek electronics co.,ltd. property of ligitek only 1.03.04.0 0 1 1.0 r e l a t i v e i n t e n s i t y @ 2 0 m a wavelength (nm) 450 0.0 400500550 0.5 0.5 r e l a t i v e i n t e n s i t y @ 2 0 m a n o r m a l i z e @ 2 5 f o r w a r d v o l t a g e @ 2 0 m a n o r m a l i z e @ 2 5 20 ambient temperature( ) ambient temperature( ) 0 -20 -40 0.8 0 -40-20 100 80 60 40 20 0.0 60100 80 40 fig.4 relative intensity vs. temperature 2.5 1.0 0.9 1.1 1.5 1.0 2.0 fig.3 forward voltage vs. temperature 1.2 3.0 r e l a t i v e i n t e n s i t y n o r m a l i z e @ 2 0 m a f o r w a r d c u r r e n t ( m a ) forward current(ma) forward voltage(v) 2.05.0110 0.0 0.5 1.0 1.5 2.0 1001000 fig.2 relative intensity vs. forward current fig.1 forward current vs. forward voltage 2.5 3.0 1 10 100 1000 dbk chip page3/5 part no. LDBK43743
dip soldering preheat: 120 c max preheat time: 60seconds max ramp-up 2 c/sec(max) ramp-down:-5 c/sec(max) solder bath:260 c max dipping time:3 seconds max distance:2mm min(from solder joint to body) 150 time(sec) 60 seconds max 2 /sec max 120 25 0 0 preheat 260 50 100 5 /sec max 260 c3sec max temp( c) ligitek electronics co.,ltd. property of ligitek only 2.wave soldering profile soldering condition(pb-free) 1.iron: soldering iron:30w max temperature 350 c max soldering time:3 seconds max(one time) distance:2mm min(from solder joint to body) page 4/5 part no. LDBK43743
mil-std-202: 208d mil-std-750: 2026 mil-std-883: 2003 jis c 7021: a-2 1.t.sol=260 5 2.dwell time= 10 1sec. 1.ta=105 5 &-40 5 (10min) (10min) 2.total 10 cycles 1.t.sol=230 5 2.dwell time=5 1sec solder resistance test solderability test thermal shock test this test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. this test intended to see soldering well performed or not. the purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. mil-std-202: 210a mil-std-750: 2031 jis c 7021: a-1 mil-std-202: 107d mil-std-750: 1051 mil-std-883: 1011 reliability test: the purpose of this is the resistance of the device which is laid under condition of high temperature for hours. 1.ta=-40 5 2.t=1000 hrs (-24hrs, +72hrs) 1.ta=105 5 2.t=1000 hrs (-24hrs, +72hrs) 1.ta=65 5 2.rh=90%~95% 3.t=240hrs 2hrs low temperature storage test high temperature high humidity test high temperature storage test the purpose of this is the resistance of the device which is laid under condition of low temperature for hours. the purpose of this test is the resistance of the device under tropical for hours. 1.under room temperature 2.if=20ma 3.t=1000 hrs (-24hrs, +72hrs) test item operating life test description test condition this test is conducted for the purpose of detemining the resistance of a part in electrical and themal stressed. mil-std-202:103b jis c 7021: b-11 jis c 7021: b-12 mil-std-883:1008 jis c 7021: b-10 reference standard mil-std-750: 1026 mil-std-883: 1005 jis c 7021: b-1 ligitek electronics co.,ltd. property of ligitek only page5/5 part no. LDBK43743
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